飯塚 貴弘TAKAHIRO IIZUKA
Last Updated :2024/05/07
- 所属・職名
- 広島大学
- メールアドレス
- iizukahiroshima-u.ac.jp
基本情報
主な職歴
- 2012年04月01日, 広島大学, HiSIM研究センター, 准教授
- 2023年04月, 9999年, 広島大学, HiSIM研究センター, 特任教授
学位
研究キーワード
- コンパクトモデル
- デバイス物理
- 回路シミュレーション
- デバイスシミュレーション
- PDK
- キャリア輸送
- 半導体素子
所属学会
- 応用物理学会, 2012年, 9999年
- 電子情報通信学会, 2012年, 9999年
- IEEE, 1995年, 9999年
研究活動
学術論文(★は代表的な論文)
- Analytical Vth Modeling for Dual-Gate MOSFETs With Independent Gate Control, IEEE Transactions on Electron Devices, 69巻, 10号, pp. 5456-5461, 20221001
- Operating-Condition Optimization of MG-MOSFETs for Low-Voltage Application, 6th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2022, pp. 97-99, 2022
- Optimization of Low-Voltage-Operating Conditions for MG-MOSFETs, IEEE Journal of the Electron Devices Society, 10巻, pp. 913-919, 2022
- Miller-Capacitance Analysis of High-Voltage MOSFETs and Optimization Strategies for LowPower Dissipation, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2021-September巻, pp. 44-47, 20210927
- History effect investigation in SOI MOSFET for minimizing impact on circuit performance, 4th International Symposium on Devices, Circuits and Systems, ISDCS 2021 - Conference Proceedings, 20210303
- Simulation-Based Power-Loss Optimization of General-Purpose High-Voltage SiC MOSFET Circuit under High-Frequency Operation, IEEE Access, 9巻, pp. 23786-23794, 2021
- Compact modeling of radiation effects in thin-layer SOI-MOSFETs, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2020-September巻, pp. 319-322, 20200923
- Universal feature of trap-density increase in aged MOSFET and its compact modeling, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2020-September巻, pp. 109-112, 20200923
- Predictive compact modeling of abnormal LDMOS characteristics due to overlap-length modification, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2020-September巻, pp. 157-160, 20200923
- History Effect on Circuit Performance of SOI-MOSFETs, 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020 - Proceedings, 20200304
- Modeling of Short-Channel Effect on Multi-Gate MOSFETs for Circuit Simulation, 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020 - Proceedings, 20200304
- Carrier Dynamics in Lightly-doped Resistance Region in Power MOSFETs, 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020 - Proceedings, 20200304
- Compact Modeling of Multi-Gate MOSFETs for High-Power Applications, IEEE Journal of the Electron Devices Society, 8巻, pp. 1381-1389, 2020
- Advanced Short-Channel-Effect Modeling With Applicability to Device Optimization - Potentials and Scaling, IEEE Transactions on Electron Devices, 66巻, 9号, pp. 3726-3733, 201909
- Modeling of temperature-dependent mosfet aging, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2019-September巻, 201909
- Prevention of highly power-efficient circuits due to short-channel effects in MOSFETs, IEICE Transactions on Electronics, E102C巻, 6号, pp. 487-494, 201906
- Validation on duality in impact-ionization carrier generation at the onset of snapback in power mosfets, 2019 2nd International Symposium on Devices, Circuits and Systems, ISDCS 2019 - Proceedings, 20190521
- Compact Modeling for Leading-Edge Thin-Layer MOSFETs with Additional Applicability in Device optimization toward Suppressed Short-Channel Effects, 2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019, pp. 29-31, 201903
- Potential-Based Modeling of Depletion-Mode MOSFET Applicable for Structural Variations, IEEE Transactions on Electron Devices, 66巻, 1号, pp. 52-59, 201901
- Leading-Edge Thin-Layer MOSFET Potential Modeling Toward Short-Channel Effect Suppression and Device Optimization, IEEE Journal of the Electron Devices Society, 7巻, pp. 1293-1301, 2019
- Recent Challenges in Compact Modeling of Short-Channel Effect for Leading-Edge Types of MOSFETs, 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 - Proceedings, 20181205
- Consistent Modeling of Snapback Phenomenon Based on Conventional I-V Measurements, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2018-September巻, pp. 159-162, 20181128
- Compact modeling for power efficient circuit design, European Solid-State Device Research Conference, 2018-September巻, pp. 234-237, 20181008
- Compact modeling applicable for power efficient circuit design, 2018 International Symposium on Devices, Circuits and Systems, ISDCS 2018, pp. 1-4, 20180611
- MOSFET optimization toward power efficient circuit design, 2018 International Symposium on Devices, Circuits and Systems, ISDCS 2018, pp. 1-4, 20180611
- Compact modeling of normally-on mosfet applicable for any technology generations, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2017-September巻, pp. 261-264, 20171025
- Compact modeling of power devices embedded in advanced low-power CMOS circuits, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 209-212, 20161020
- Modeling of NBTI stress induced hole-trapping and interface-state- generation mechanisms under a wide range of bias conditions, IEICE Transactions on Electronics, E96-C巻, 10号, pp. 1339-1347, 201310
- Modeling of trench-gate type HV-MOSFETs for circuit simulation, IEICE Transactions on Electronics, E96-C巻, 5号, pp. 744-751, 201305
- Analysis and modeling of geometry dependent thermal resistance in silicon-on-insulator metal-oxide-semiconductor field-effect transistors, Japanese Journal of Applied Physics, 52巻, 4 PART 2号, 201304
- Modeling of the impurity-gradient effect in high-voltage laterally diffused MOSFETs, IEEE Transactions on Electron Devices, 60巻, 2号, pp. 684-690, 2013
- Parameter extraction and comparison of self-heating models for power MOSFETs based on transient current measurements, IEEE Transactions on Electron Devices, 60巻, 2号, pp. 708-713, 2013
- The second-generation of HiSIM-HV compact models for high-voltage MOSFETs, IEEE Transactions on Electron Devices, 60巻, 2号, pp. 653-661, 2013
- Compact reliability model for degradation of advanced p-MOSFETs due to NBTI and hot-carrier effects in the circuit simulation, IEEE International Reliability Physics Symposium Proceedings, 2013
- Compact modeling of expansion effects in LDMOS, IEICE Transactions on Electronics, E95-C巻, 11号, pp. 1817-1823, 201211
- Self-heating parameter extraction of power metal-oxide-silicon field effect transistor based on transient drain current measurement, IETE Journal of Research, 58巻, 3号, pp. 230-236, 201205
- Unified reaction-diffusion model for accurate prediction of negative bias temperature instability effect, Japanese Journal of Applied Physics, 51巻, 2 PART 2号, 201202
- Modeling of trench-gate type HV-MOSFETs for circuit simulation, Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012, pp. 748-751, 2012
- Development of predictive model and circuit simulation methodology for negative bias temperature instability effects, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 213-216, 2012
- Characterization of time dependent carrier trapping in poly-crystalline tfts and its accurate modeling for circuit simulation, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 71-74, 2012
- Compact thermal-interaction model for dynamic within chip temperature determination by circuit simulation, IEEE International Conference on Microelectronic Test Structures, pp. 187-190, 2012
- Experimental extraction of substrate-noise coupling between MOSFETs and its compact modeling for circuit simulation, IEEE International Conference on Microelectronic Test Structures, pp. 101-104, 2012
- Self-heating parameter extraction of power MOSFETs based on transient drain current measurements and on the 2-cell self-heating model, IEEE International Conference on Microelectronic Test Structures, pp. 191-195, 2012
- Accurate spice modeling of 80V power LDMOS with interdigitated source structure, Proceedings of the International Symposium on Power Semiconductor Devices and ICs, pp. 101-104, 2012
- HiSIM-SOTB: A compact model for SOI-MOSFET with ultra-thin Si-layer and BOX, Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012, pp. 792-795, 2012
- Modeling of DMOS device for high-voltage applications based on 2D current flow, Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012, pp. 752-755, 2012
- Modeling of degradation caused by channel hot carrier and negative bias temperature instability effects in p-MOSFETs, ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, 2012
- Modeling of power devices for enabling smart energy consumption, ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, 2012
- Effect of carrier transit delay on complementary metal-oxide-semiconductor switching performance, Japanese Journal of Applied Physics, 49巻, 4 PART 2号, 201004
- An efficient method of calibrating MOSFET capacitances by way of excluding intra- DUT parasitic contributions, IEEE International Conference on Microelectronic Test Structures, pp. 164-169, 2010
- Proposal of a fitting accuracy metric suitable for compact model qualification in all MOSFET operation regions, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 251-254, 2010
- Degraded frequency-tuning range and oscillation amplitude of LC-VCOs due to the Nonquasi-Static effect in MOS varactors, IEICE Transactions on Electronics, E92-C巻, 6号, pp. 777-784, 2009
- Non-quasi-static carrier dynamics of MOSFETs under low-voltage operation, IEICE Transactions on Electronics, E92-C巻, 5号, pp. 608-615, 2009
- Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations, Mathematics and Computers in Simulation, 79巻, 4号, pp. 1096-1106, 20081215
- Frequency dependence of measured metal oxide semiconductor field-effect transistor distortion characteristic, Japanese Journal of Applied Physics, 47巻, 4 PART 2号, pp. 2610-2615, 200804
- Non-quasi-static carrier dynamics of MOSFETs under low-voltage operation, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 1051-1054, 2008
- Surface-potential-based metal-oxide-silicon-varactor model for RF applications, Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46巻, 4 B号, pp. 2091-2095, 200704
- HiSIM2.4.0: Advanced MOSFET model for the 45nm technology node and beyond, 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 3巻, pp. 479-484, 2007
- HiSIM-varactor: Complete surface-potential-based model for RF applications, 2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings, 3巻, pp. 621-624, 2007
- STARC'S semiconductor design technology research activities and the HISIM2 advanced mosfet model project, Proceedings of the 14th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2007, pp. 41-46, 2007
- HiSIM2: Advanced MOSFET model valid for RF circuit simulation, IEEE Transactions on Electron Devices, 53巻, 9号, pp. 1994-2006, 200609
- On the validity of conventional MOSFET nonlinearity characterization at RF switching, IEEE Microwave and Wireless Components Letters, 16巻, 3号, pp. 125-127, 200603
- Noise modeling based on self-consistent surface-potential description for advanced MOSFETs aiming at RF applications, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, pp. 1264-1267, 2006
- Analysis and compact modeling of MOSFET high-frequency noise, International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, pp. 158-161, 2006
- Advanced compact MOSFET model HiSIM2 based on surface potentials with a minimum number of approximation, 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings, 3巻, pp. 638-643, 2006
- Gate-length and drain-voltage dependence of thermal drain noise in advanced metal-oxide-semiconductor-field-effect transistors, Applied Physics Letters, 87巻, 9号, 20050829
- MOSFET harmonic distortion analysis up to the non-quasi-static frequency regime, Proceedings of the Custom Integrated Circuits Conference, 2005巻, pp. 827-830, 2005
- Noise modeling with HiSIM based on self-consistent surface-potential description, 2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004, 2巻, pp. 66-69, 2004
- MOSFET modeling for RF-circuit simulation, International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT, 2巻, pp. 1118-1122, 2004
外部資金
競争的資金等の採択状況
- Beyond 5G研究開発促進事業, 単原子長ゲートによる低環境負荷物質から成る高出力THz帯増幅器の創出(分担), 2022年08月26日, 2024年03月31日
- 未来社会創造事業, 大規模集積化に向けた物理モデルの構築(分担), 2022年10月01日, 2024年03月31日